Publicado em 04/07/2021

Call for Papers

Workshop @LADC 2021

STAMP Latin-American Workshop

Workshop page:

The STAMP Latin-American Workshop is part of the LADC 2021 - 10th Latin-American Symposium on Dependable Computing, Nov 22-26 2021.

Due to the Covid-19 pandemic, the STAMP Latin-American Workshop will be an online-only event.

Latest news

  • Keynote speaker: Prof. Nancy Leveson (Professor of Aeronautics and Astronautics at MIT). Title of the talk: “New Developments in STAMP”
    • Date and time: November 25th, 2021, Thursday, 11 AM
    • Prof. Leveson is the creator of the System-Theoretic Model of Accidents (STAMP) approach. She has authored several papers and supervised several graduate students. The theses, dissertations, books, and papers demonstrate the application of the new tools to a variety of engineered systems.
    • More info:
  • The program of the Workshop is available on

  • Due to some requests, the deadlines were extended (second extension). The new dates are:
    • Manuscript submission: September 19th, 2021
    • Notification of acceptance: October 2nd, 2021
    • Camera-ready: October 10th, 2021

General Info

STAMP (System-Theoretic Accident Model and Processes) is a new accident causality model based on systems theory and systems. STAMP addresses critical challenges in safety and cybersecurity such as complex software, human-decision making, human factors, new technology, social and organizational design, and safety culture. STPA (System-Theoretic Process Analysis) is a STAMP-based method for hazard analysis that is used to identify safety and cybersecurity constraints, loss scenarios, and requirements. CAST is a method to perform accident/incident analysis. The method identifies not only human errors or hardware failures but also systemic reasons that lead to accidents.

There is a growing interest in STAMP and its methods in the last decade. We understand that the STAMP Latin-American Workshop is an excellent opportunity for practitioners especially those from Latina America to meet, learn, share experiences, and cooperate to improve the use of the STAMP methods. Until 2020, ten STAMP workshop editions took place in the United States, seven occurred in Europe, and four in Japan. Participants come from industry, government, and academia. They are from sectors such as automotive, aviation, air traffic control, space, medical devices, nuclear, rail, chemicals, oil and gas, and healthcare.

Researchers and professionals are invited to submit original papers for presentation in two categories: (1) full research (regular) papers, and (2) practical experience reports. The papers will be evaluated according to the criteria of each category. Full research manuscripts should address a scientific problem; propose a solution, using a methodology; and present extensive results. Practical experience reports are expected to provide an in-depth and complete application of STAMP, STPA or related methods. The reports must also present original insights of the method application.

Possible topics for presentations include (not limited to):

  • Experiences using STPA, STPA-Sec, and CAST
  • Information about the practicality of STPA and CAST
  • Certification and regulatory issues
  • Evaluations and comparisons with traditional techniques
  • Risk management and identifying leading indicators
  • Applications to security and other areas such as workplace safety
  • Safety Management System development and evaluation
  • Extensions of STPA and CAST for specific analyses
  • Applications to other emergent properties (beyond safety and security)

Workshop goals:

  • To allow the participants of different sectors to share their experiences and viewpoints.
  • To bring valuable experience and ideas emphasizing practical applications and research to improve safety, security, and dependability analyses.
  • To collect understanding of effective STAMP experiences of research groups, industries, and organizations in Latin America.

LADC participants will have the opportunity to familiarize and know about applications and research about STAMP, STPA, and CAST.

Workshop Format

One day of online event containing:

  • Invited speaker: Prof. Nancy Leveson (Department of Aeronautics and Astronautics - MIT)
  • Presentations of practical experience papers
  • Presentations of research papers
  • Industry panel (TBA). We intend to invite industry and R&D professionals who are conducting large projects of safety-critical systems.

Paper submission information

Practical experience: submission of a 4-page description of the experience about STAMP, STPA, CAST or related work. It is necessary to include enough information to evaluate the content of the practical experience for appropriateness at the workshop and the correctness of the analysis.

Research paper: submission of a 6-10-page research paper related to STAMP, STPA, or CAST.
Research papers will be evaluated according to the methodology, proposal, and results to address the research problem.

Accepted papers are expected to be published by IEEE. The paper must follow the IEEE two-column format for conference proceedings.

The category of the paper (practical experience or research) should be clearly indicated on the first page.

Authors must register their submissions first and then submit their manuscripts in PDF format at the JEMS webpage.

We expect to start the submission on Aug 5th, 2021.

Mode of presentation

Virtual presentations. The presenters shall prepare and upload a video beforehand. Instructions will be provided later by email.

The presenters shall be available to answer questions after the presentation.


  • Manuscript submission: Sept 19, 2021
  • Notification of acceptance: Oct 2nd, 2021
  • Camera-ready: Oct 10, 2021
  • Symposium: Nov 22-26, 2021

Preliminary Program Committee

  • Carlos Lahoz - ITA
  • Celso Massaki Hirata - ITA
  • Luiz Eduardo Galvão Martins - UNIFESP
  • Emilia Villani - ITA
  • Ana Maria Ambrósio - Omega7 Systems & INPE
  • João Batista Camargo Junior - USP/Poli
  • Nuno Pedro Silva - Critical Software
  • Juliana de Melo Bezerra - ITA

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